Teaching

This course provides an introductory survey of elementary quantum physics, as well as basic relativistic dynamics. Topics include the photon, wave-particle duality, deBroglie waves, the Bohr model of the atom, the Schrodinger equation and wave mechanics, quantum description of the hydrogen atom, electron spin, and multi-electron atoms.

In this seminar course students will present their latest research and learn about the research taking place in the program. All Microsystems Ph.D. students enrolled full time are required to attend each semester they are on campus.

The intent of this course is to provide a comprehensive review of the fundamental concepts of materials science and engineering with applications to nano- and microsystems. Topics include crystallography, diffusion, phase diagrams, fluids, and thermal, elastic, electrical, optical and magnetic properties. This course provides students in the engineering or science fields of nano- and microsystems with the background for future coursework and research in materials engineering and applications.

This course provides a comprehensive overview of theoretical principles, instrumentation, applications, and practical concepts related to advanced techniques for characterization of nanoscale materials and systems. Topics include: diffraction theory, low-energy and reflection high-energy electron diffraction, X-ray diffraction, X-ray reflectivity; analytical scanning electron microscopy techniques including electron beam-induced current, energy-/wavelength-dispersive X-ray spectrometry, and electron backscatter diffraction; analytical transmission electron microscopy techniques including selected-area and convergent-beam electron diffraction, electron energy-loss spectroscopy, energy-filtered imaging, and electron holography; focused ion beam-based characterization and patterning; spectroscopic techniques including photo-, electro-, and cathodo-luminescence spectroscopy, Raman spectroscopy, and Auger electron spectroscopy; scan probe microscopy techniques including atomic force, magnetic force, photo-induced force, Kelvin probe force, scanning tunneling, scanning near-field optical, and scanning microwave impedance microscopy; and ion beam techniques including secondary ion mass spectrometry and local electrode atom probe tomography. The above techniques will be explored with the aid of case studies from the current literature. Lecture content will be reinforced by active demonstrations conducted in various labs at RIT and University of Rochester.

This is a variable credit, variable special topics course that can be in the form of a course that is not offered on a regular basis.

Topics and subject areas that are not regularly offered are provided under this course. Such courses are offered in a normal format; that is, regularly scheduled class sessions with an instructor.