Forensic Document Examiners Seminar set for April

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RIT will host The Printing Process Identification and Image Analysis for Forensic Document Examiners seminar from April 23 to April 26. Its targeted toward document examiners, forensic scientists, criminologists, fraud investigators and government employees who work in crime labs.

Rochester Institute of Technology will host a highly specialized seminar from April 23 to 26 to help forensic document examiners successfully identify fraudulent documents. Attendees will learn about the latest in traditional graphic arts processes and digital printing technologies that are used to determine the authenticity of currency, stamps, passports and other legal papers.

The seminar is targeted toward questioned document examiners, forensic document examiners, forensic scientists, criminologists, fraud investigators and government employees who work in or with crime labs.

The Printing Process Identification and Image Analysis for Forensic Document Examiners seminar will be held on the RIT campus. There will be lectures and live demonstrations of the newest image capture and analysis systems. Attendees will learn how to compare documents produced by traditional printing processes with fraudulent replicas produced by non-impact technologies such as inkjet, electrostatic printing, dye diffusion, laser printing, xerography and thermal transfer.

Topics will include conventional printing processes, conventional process image structure, non-impact printing, paper substrates, inks and image analysis.

The seminar’s instructors are Milton Pearson, who has a career spanning 30 years as an imaging scientist at RIT; Tom Jay, vice president of SICPA Securink USA; Majid Rabbani, a Kodak Research Fellow and head of the image compression and video processing technology areas in the Imaging Science division of Eastman Kodak Co.; David Tobin, president of Foster & Freeman USA, and Owen Lang, senior applications engineer at Foster & Freeman USA. The company designs and manufactures systems for the examination of question documents, latent fingerprints, trace evidence and shoe prints. Rounding out the list of presenters are Mike Caffrey, business development manager for security products for Appleton; Amanda Moffett, document analyst with the U.S. Secret Service who specializes in document authentication and instrumental analysis; and Joseph Stephens, a document analyst with the U.S. Secret Service who conducts ink, paper and toner comparisons and document authentication examinations on an array of submitted documents.

The program fee is $1,395. To register go to RIT Printing Applications Laboratory website or call 585-475-2687.

The forensic document examiners seminar at RIT is in its 13^th year and is offered semiyearly.